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美国国际商用机器公司的两位科学家已研究出一种试验性的激光扫描方法。用这种方法可以在硅片用于安装复杂的计算机线路之前,就检查出其内部极微的缺陷。用两面
Two scientists at American International Business Machines Corporation have developed a pilot laser scanning method. With this method, the silicon can be checked for minor defects before it can be used to install complex computer circuits. With two sides