通过对小麦红外照相和光谱反射率测定,以及对不同数量蚜虫为害减产等情况调查研究,得到在光谱特性上受蚜害小麦跟正常小麦具有明显差别,特别是第三与第四波段(红外)差异更为突出,反映在红外照相上差异同样明显。根据不同蚜量为害小麦(无土栽培)的试验结果进行统计分析,得到蚜量与产量,蚜量与株高的线性回归模式。 Through the investigation of wheat infrared imaging and spectral reflectance, as well as the damage reduction and yield of different numbers of aphids, the spectral characteristics of wheat affected by aphids were significantly different from that of normal wheat, especially in the third and fourth bands (infrared) The difference is more prominent, reflected in the infrared camera the same obvious differences. Based on the statistical analysis of the test results of different amount of aphid-affected wheat (soilless culture), a linear regression model of aphid quantity and yield, aphid quantity and plant height was obtained.