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寿命试验是鑑定器件质量和检查材料、工艺的一种有效方法:它是电子器件例行试验中必须进行的主要试验项目。随着电子器件质量的不断提高,加上新工艺,新材料的不断使用,其寿命增加很快,普遍地将达到10000小时以上的水平。在这种情况下,用常规的寿命试验方法来鑑定电子器件质量和检查材料,工艺性能是远远不能满足生产上的要求。我们很希望用一种快速的寿命试验方法来代替常规的试验方法,这样才能及时地指导生产,并加快长寿命材料、工艺的研究步伐。 加速寿命试验方法在一些电子器件中已经有效地加以应用
Life test is to identify the quality of the device and check the material, process an effective method: it is the routine test of electronic devices must be the main pilot project. With the continuous improvement of the quality of electronic devices, coupled with the continuous use of new technology, new materials, its life expectancy increased rapidly, generally reached the level of 10,000 hours or more. In this case, the conventional life test method to identify the quality of electronic devices and check the material, the process performance is far from meeting the production requirements. We very much hope that a rapid life test method to replace the conventional test methods, so as to promptly guide the production, and accelerate the long-life materials, process research pace. Accelerated life test methods have been effectively applied in some electronic devices