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单粒子锁定防护设备用于保证CMOS器件的正常工作,避免单粒子锁定效应(SEL,Single Event Latchup)带来的诸多危害。为了实现对SEL防护设备软件功能的验证,设计了一种新型模拟SEL故障注入和消除的模块。本文从硬件和软件两个方面阐述了对该模块的设计,通过增加CMOS器件电源输入端的电流,实现了SEL的模拟注入。使用VA140芯片SEL防护电路对该模块进行了检验、测试,测试的结果证明该模块可以实现SEL模拟注入,从而对SEL防护设备的软件功能进行验证。最后,该模块被成功用于硅阵列探测器的电子学读出系统软件中单粒子防护部分的功能测试,从另一个侧面说明了该模块的应用。
The single-particle-locked protection device is used to ensure the normal operation of the CMOS device and avoid the many hazards caused by the single event latch-up (SEL). In order to validate the function of SEL protection device software, a new module for simulating SEL fault injection and elimination is designed. This article describes the design of the module from two aspects of hardware and software, and realizes the simulation injection of SEL by increasing the current of the power input end of the CMOS device. The module was tested using the SEL protection circuit of the VA140 chip. The results of testing and testing proves that the module can implement SEL simulation injection to verify the software functions of the SEL protection device. Finally, the module was successfully used for functional testing of the single particle protection part of the electronic readout system software of the silicon array detector, and the application of the module was illustrated from another aspect.