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MTTF(Mean Time to Failure)平均失效时间,或称有效寿命,是半导体器件可靠性的基本参数,通常在最高工作结温下1×10~6小时,MTTF有效寿命是行业内的常规可靠性考核指标。例如:现已成熟商用的硅(Si)或砷化镓(GaAs)半导体器件在结温(沟道温度)150℃～160℃时,MTTF值均都能满足一百万小时的有效寿命。近年来,基于SiC衬底的GaN功率器件在RF功率放大领域的应用正逐渐被RF微波半导体行业所关注。氮化镓材料以它固有的物理特性:宽能带隙、高击
Mean Time to Failure (MTTF) The average failure time, or effective lifetime, is a fundamental parameter of semiconductor device reliability. Generally, it is 1 × 10 ~ 6 hours at the highest operating junction temperature. The MTTF effective lifetime is the industry’s regular reliability assessment index. For example, the MTTF values of commercially available silicon (Si) or gallium arsenide (GaAs) semiconductor devices meet the one million-hour effective lifetime at the junction temperature (channel temperature) of 150 ° C to 160 ° C. In recent years, the application of SiC substrate based GaN power devices in the field of RF power amplification is gradually being concerned by the RF microwave semiconductor industry. Gallium nitride material with its inherent physical properties: wide bandgap, high impact