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X光谱法如今已成为一种很重要的仪器分析法。近年来文献俱增,应用范围不断扩大。自70年代以来,其进展大致归纳如下几点。首先波长色散X光谱法在仪器分析中占有了一个重要的位置。包括吸收增强效应,粒度效应以及表面结构效应在内的基体影响,大部分可用各种数学校正的办法得到解决。各种间接的分析方法把X光谱法的适用范围几乎扩大到整个周期表。新颖的多道X光谱仪在1～2分钟内可同时测量30个元素,还能对多达60个样品有条不紊地进行自动分析。
X-ray spectrometry has now become a very important instrumental analysis method. The literature has been increasing in recent years, the scope of application is constantly expanding. Since the 1970s, its progress can be summarized as follows. First, wavelength-dispersive X-ray spectroscopy takes an important place in instrumental analysis. Much of the matrix effects, including absorption enhancement effects, grain size effects and surface texture effects, can be largely solved by various mathematical corrections. Various indirect analytical methods extend the scope of X-ray spectroscopy to almost the entire periodic table. The novel multichannel X-ray spectrometer measures 30 elements simultaneously in 1 to 2 minutes and automatically analyzes up to 60 samples in an orderly fashion.