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研究了由 SiO,SnO_2,ZnS 及 CdS 介质膜分别与铜基合金(CA)所组成的 D/CA 膜系在320～1000nm波长范围内的光谱透过率(T_λ)和光谱吸光度(A_λ)。探讨了介质膜与铜合金膜对于膜系的透过率与吸光度的光谱选择特性的影响。研究结果表明,在单一铜合金膜情况下,当膜厚为5.1～30nm 时,T_λ和 A_λ的光谱选择度均无明显变化,当铜合金膜厚增加时,其 T_λ单调地下降,而 A_λ则相应增大。在 D/CA 非对称光学膜系情况下,沉积在铜合金基膜上的介质面层的性质和厚度将直接影响膜系的 A_λ波形(即光谱选择度)。由不同厚度介质膜和相同厚度铜合金基膜所组成的 D/CA 光学系统可以获得相同波形的光谱吸光度。铜基合金层的厚度对于D/CA 光学系统的光吸收起着重要作用。当铜基合金层较厚时,其 A_λ也将增大。
The spectral transmittance (T_λ) and spectral absorbance (A_λ) of D / CA films composed of SiO, SnO_2, ZnS and CdS dielectric films with Cu-based alloy (CA) were studied in the wavelength range from 320 nm to 1000 nm. The effects of dielectric film and copper alloy film on the spectral selectivity of the transmittance and absorbance of the film were discussed. The results show that the spectral selectivity of T_λ and A_λ does not change obviously when the film thickness is 5.1 ~ 30nm, while the thickness of copper alloy monotonically decreases when the film thickness of copper alloy increases, while the value of A_λ A corresponding increase. In the case of D / CA asymmetric optical films, the properties and thickness of the dielectric layer deposited on the base film of copper alloy will directly affect the A_λ waveform of the film (ie, spectral selectivity). The D / CA optical system consisting of different thickness dielectric films and the same thickness of copper alloy base film can obtain the spectral absorbance of the same waveform. The thickness of the copper-based alloy layer plays an important role in the light absorption of the D / CA optical system. When the copper-based alloy layer thicker, its A_λ will also increase.