论文部分内容阅读
Calculation of Radius of Curvature for Strained Layer Structure and Fabrication of Semiconductor Mic
【机 构】
:
CentreforPhotonicsandNanotechnology
【出 处】
:
材料科学与工程:中英文版
【发表日期】
:
2010年10期
【基金项目】
:
The authors would like to thank Dr.T.Harayama, ATR Wave Engineering Laboratory, Kyoto, Japan for extending their growth facility.
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