论文部分内容阅读
超分辨定位成像技术凭借对数千甚至数万张采集的原始图像进行单分子定位及重建,可以获得几十纳米的超高分辨率,观察到之前看不到的细胞结构以及生物现象。然而,在实际的成像过程中,采集到的图像会受到像差(来源于光学系统的不完美或样品本身的不均匀性)的影响而导致分辨率下降,甚至会造成错误结果。为此,定量表征了几种典型像差对超分辨定位成像的影响,并提出了一种基于样品图像本身的像差校正方法。仿真和实验结果表明,像差会造成系统点扩展函数的变形以及成像分辨率的下降,使用基于图像本身的像差校正方法可以恢复图像的成像质量。
Super-resolution positioning imaging technology enables thousands of or even tens of thousands of captured original images to be molecularly localized and reconstructed to achieve ultra-high resolution of tens of nanometers and to observe previously undetectable cell structures and biological phenomena. However, in the actual imaging process, the captured image will be affected by the aberration (due to the imperfections of the optical system or the inhomogeneity of the sample itself), resulting in a decrease in resolution and even wrong results. To this end, quantitatively characterize the effects of several typical aberrations on super-resolution positioning imaging and propose a method of aberration correction based on the sample image itself. The simulation and experimental results show that the aberration will cause the distortion of the system point spread function and the decrease of the imaging resolution. Using the aberration correction method based on the image itself, the image quality can be restored.