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研制一种基于单片机控制的便携式半导体激光器特性参数测试仪.该仪器由硬件测试电路和上层软件测试系统组成,能够测试各种封装形式的LD电特性参数和特性曲线.包括自动电流控制(ACC)、自动电压控制(AVC)、自动功率控制(APC)和自动背向光电流控制(AMC)四种驱动方式;包括集成的温控电路,能够快速精确控制LD工作温度;保护电路可以使LD免受浪涌冲击等损害;上层软件系统可以很直观绘制LD的各种特性曲线.测试系统还具有体积小、携带方便、操作简单等优点.
A portable semiconductor laser characteristic parameter tester based on singlechip control is developed.This instrument consists of a hardware test circuit and an upper software test system and is capable of testing LD electrical characteristic parameters and characteristic curves of various package types including automatic current control (ACC) , Automatic Voltage Control (AVC), Automatic Power Control (APC) and Automatic Backlight Current Control (AMC). These include an integrated temperature control circuit to quickly and accurately control the operating temperature of the LD. The protection circuit allows LD By the impact of surges and other damage; the upper software system can be very intuitive to draw a variety of LD characteristic curves. Test system also has small size, easy to carry, simple operation and so on.