The degradation mechanism of high power InGaN/GaN blue light emitting diodes(LEDs)is investigated in this paper.The LED samples were stressed at room temperatur
The exponent n of the generation of an interface trap(Nit),which contributes to the power-law negative bias temperature instability(NBTI)degradation,and the exp
An energy measurement system in a large-aperture high power laser experiment platform is introduced. The entire measurement system includes five calorimeters, w