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一、引言半导体探测器是近几年内迅速发展起来的新型探测元件。与其他探测元件相比,它具有很多的优点。主要优点之一,是有良好的能量分辨率。但是,器件给出的讯号幅值较小,在它本身的噪声的干扰下,能量分辨率变坏。为了能够充分发挥器件固有的高能量分辨率这一优点,所以要对探测器的噪声进行研究。半导体探测器最为重要的电性能是结电容与漏电流。结电容降低了讯号的幅值,漏电流会发生起伏,从而引起了噪声。由漏电流起伏所引起的噪声包括:由体漏电流的起伏所引起的散粒噪声和两种由频率倒数所表征的闪烁噪声。一种闪烁噪声是由探测器表面的复合中心
I. INTRODUCTION The semiconductor detector is a new type of detection element developed rapidly in recent years. It has many advantages over other detection elements. One of the main advantages is that there is good energy resolution. However, the device gives a smaller signal amplitude and degrades its energy resolution with its own noise. In order to be able to give full play to the inherent high energy resolution of the device, the noise of the detector should be studied. The most important electrical properties of semiconductor detectors are junction capacitance and leakage current. The junction capacitance reduces the amplitude of the signal, and the leakage current fluctuates, causing noise. The noise caused by the leakage current fluctuation includes the shot noise caused by the fluctuation of the body leakage current and two kinds of flicker noise characterized by the reciprocal frequency. A flicker noise is the compound center of the detector surface