1)原理 α粒子在物质中的能量损失是非线性的,其能量主要损失在射程的末端。因而受照固体中α粒子产生的潜迹,其最易获得径迹的位置便在此射程的末端。用预蚀刻来剥离到这一灵敏位置,同时清洁背景和减少本底径迹。然后径迹通过电化学蚀刻放大,并形成树枝状。再用一般光学显微镜进行径迹密度测量,由径迹密度换算出暴露量。探测器为聚碳酸酯塑料基片。 1) Principle Alpha energy loss in matter is non-linear and its energy is mainly lost at the end of the range. Therefore, exposure to solid particles generated α particles, the most easy to get track position will be at the end of this range. Pre-etch to peel to this sensitive position, while cleaning the background and reduce the background track. The tracks are then enlarged by electrochemical etching and dendritic. The track optical density was measured by a general optical microscope, and the exposure amount was calculated from the track density. The detector is a polycarbonate plastic substrate.