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讨论利用红外显微测温仪测量物体微小表面真实温度的方法。通过分析测量 目标大小，响应波长范围和物体表面发射率对红外探测器响应特性的影响．提出计算非 黑体表面真实温度的表达式，并且得到满意的实验验证。利用该红外系统成功地测量了 微波功率管芯片表面的发射率分布以及在直流热耗散下芯片结区的温度分布，计算了峰 值热阻和平均热阻，为微波功率管的热设计提供了实验依据。
Discusses the method of measuring the true temperature of the tiny surface of an object by using the infrared microscope thermometer. By analyzing the measurement target size, response wavelength range and the surface emissivity of the infrared detector response characteristics. The expression of calculating the true temperature of non-blackbody surface is proposed, and the satisfactory experiment is verified. The infrared system was used to measure the emissivity distribution of the surface of the microwave power tube chip and the temperature distribution of the junction area of the chip under DC heat dissipation. The peak thermal resistance and the average thermal resistance were calculated, which provided the thermal design of the microwave power tube Experimental basis.