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本项目是由北京自动测试技术研究所承担的,属国际前沿科研课题,内容涉及微电子测试与设计等多项重要内容,具有重要的理论意义和实用价值。其主要成果为:提出一种层次化自测试体系结构,实现了电子系统的逐级自测试;提出了一种适用于数模混合电路的可测性设计方法,提高了数模混合电路中模拟信号的可控制性与可观察性;提出一种测试处理器结构设计,此处理器能够实现模拟
This project is undertaken by Beijing Institute of Automatic Test Technology, which belongs to international advanced scientific research topics and covers many important contents such as microelectronic testing and design. It has important theoretical significance and practical value. The main achievements are as follows: A hierarchical self-test architecture is proposed to realize the step-by-step self-testing of electronic systems. A testable design method for digital-analog hybrid circuits is proposed, which improves the simulation Signal controllability and observability; proposed a test processor structure design, the processor can simulate