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IC 测试系统的发展趋势跟随 IC 的发展趋势,用于生产测试和验证测试的 IC 测试系统也得到了很大的发展。分析其发展趋势,可以归纳为以下几个方面:1.测试通道数增加IC 集成度的不断提高和专用集成电路的出现,使器件的引脚数不断增加,IC 测试系统的测试通道数也相应不断增加。以数字系统而言,由早期测试中、小规模集成电路的24通道测试系统,测试大规模集成电路的48通道、64通道测试系统发展到测试超大规模集成电路的128通道、256通道甚至更多通道数的测试系统,如 Teradyne 公司的 VLSI 测试系统 In-
The development trend of IC test system follows the trend of IC, and the IC test system used for production test and verification test has also been greatly developed. Analysis of its development trend, can be summarized as the following aspects: 1. The number of test channels to increase the continuous improvement of IC integration and the emergence of ASICs, the pin count of the device is increasing, the number of test channels IC test system also corresponds to Increasing. In digital systems, from the early tests, the 24-channel test system for small scale integrated circuits, the 48-channel, 64-channel test systems for testing large scale integrated circuits evolved to 128 channels, 256 channels or more for testing very large scale integrated circuits The number of channels of test system, such as Teradyne’s VLSI test system In-