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研究了基体铟对１５种杂质分析元素谱线的背景影响和光谱谱线干扰，采用基体匹配－电感耦合等离子体发射光谱法测定了三乙基铟中的１５种杂质元素。样品分析方法的检出限大部分低于１μｇ／ｇ，相对标准偏差均小于２％。
The influence of substrate indium on 15 kinds of impurity analysis elements and the spectral line interference were studied. Fifteen kinds of impurity elements in triethylindium were determined by matrix matching-inductively coupled plasma atomic emission spectrometry. Most of the detection limits of the sample analysis methods are below 1μg / g, with relative standard deviations less than 2%.