一、引言在X射线荧光光谱分析中,基体效应问题是一个很复杂的问题。分析样品中的主成分时,要想得到准确可靠的分析结果,必须校正基体成分对分析谱线强度的影响。一般说来,基体成分对分析谱线强度的影响可以分为三类:一是由于基体的化学成分引起的,例如,谱线的吸收增强效应,背景强度的改变。二是由于基体的物理状态引起的,例如,试样的粒度、不均匀性和表面几何形状等因素的影响。三是由于基体的物质结构引起的,例如,谱线 I. INTRODUCTION In X-ray fluorescence spectrometry, the matrix effect problem is a complex one. When analyzing the main components in a sample, to obtain accurate and reliable analysis results, it is necessary to correct the influence of matrix components on the intensity of the analysis lines. In general, the influence of matrix composition on the analysis of spectral lines can be divided into three categories: First, due to the chemical composition of the matrix caused, for example, absorption enhancement effect of lines, background intensity changes. Second, due to the physical state of the substrate, for example, the particle size, inhomogeneity and surface geometry of the sample and other factors. Third, due to the material structure of the matrix caused, for example, spectral lines