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在GEM探测器电子学读出系统中,GEM探测器未加高压,因此没有信号传入APV25前端卡,整套电子学在无实验数据接收下进行测试。图1给出了电子学系统简易搭建框图。MPD可读取16块APV25的数据流,它是基于VME64X架构的6U面板,12位ADC,采样速率可达480 Mbit/s。测试中由于GEM探测器未加高压,所以NIM触发信号由脉冲发生器提供,APV25数据经MPD转换,通过光纤传入计算机。由于每块MPD可容纳16块APV25前端卡的数据传输,因此在MPD与APV25前端卡之间,采用了专门设计的集线器基板,每块基板上可连
In the GEM detector electronics readout system, the GEM detector is not under high voltage, so there is no signal to the APV25 front-end card, and the complete electronics is tested without experimental data. Figure 1 shows the electronic system easy to set up the block diagram. The MPD reads 16 APV25 data streams, a 6U panel based on the VME64X architecture with a 12-bit ADC and a sample rate of 480 Mbit / s. In the test, because the GEM detector is not under high voltage, the NIM trigger signal is provided by the pulse generator. The APV25 data is MPD converted and transmitted to the computer through the optical fiber. Because each MPD can accommodate up to 16 APV25 front-end cards for data transfer, a specially designed hub substrate is used between the MPD and APV25 front-end cards,