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该文分析了ＬａＡｌＯ＿３单晶片由于准立方晶系｛ｈｋｌ｝＿ｃＸ射线衍射峰的劈裂情况，发现｛ｈｏｌ｝＿ｃ峰的劈裂情况较简单。用非对称Ｘ射线衍射技术测量了（ｏｏｌ）。切向晶片｛ｈｏｌ｝＿ｃ峰的劈裂角距离，建立了该角距离与ＬａＡｌＯ＿３三方晶系晶胞参数α的关系，实现了ＬａＡｌＯ＿３单晶片立方度的无损测量。为研究生长、热处理过程中高温超导ＹＢＣＯ膜与衬底缺陷的相互关系打下基础。
In this paper, we analyze the cleavage of the {hol} _c peak due to the cleavage of the {hkl} _cX diffraction peak of the LaAlO_3 single-crystal wafer. (Ool) was measured by asymmetric X-ray diffraction. The relationship between the angular distance and the lattice parameter α of LaAlO_3 trigonal system was established, and the non-destructive measurement of the cubic degree of LaAlO_3 single crystal was achieved. In order to study the growth, heat treatment during the high temperature superconducting YBCO film and substrate defects laid the foundation for the interrelationship.