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发射光谱法直接测定地质化探样品中钨的灵敏度较低,一般为3～5ppm,不能满足地质化探分析的要求。本方法以CdCl_2-NaF作为反应剂,通过大量镉盐的蒸发控制电弧温度,使被测元素预先分馏,有效地改善了它们的蒸发行为,降低了光谱背景,使钨的检出限降低为0.6ppm。本方法基体效应小,具有良好的准确度和精密度,各元素的检出限(ppm)为:W(0.6),Mo(0.1),B(3.2),Ag(0.028),Sn(0.37),Co(0.38),V(0.15),Cr(1.8),Ni(3.5),Pb(1)。各元素的相对偏差(RSD)为4.06～9.94%。试验与结果一标准配制基物的组成为:SiO_2 74、Fe_2O_5 5、Al_2O_5 12、MgO 2、CaCO_3 2、K_2SO_4 3、Na_2CO_5 2%。在玛瑙研钵中磨匀,经800℃焙烧10小时后再次磨匀。SiO_2
Emission spectroscopy method for the direct determination of geochemical samples of tungsten in the sensitivity of the lower, usually 3 ~ 5ppm, geochemical analysis can not meet the requirements of analysis. In this method, CdCl_2-NaF is used as a reactant to control the arc temperature through the evaporation of a large amount of cadmium salt, pre-fractionating the tested elements, effectively improving their evaporation behavior, reducing the spectral background and reducing the detection limit of tungsten to 0.6 ppm. The method has the advantages of small matrix effect, good accuracy and precision, and the detection limits (ppm) of the respective elements are as follows: W 0.6, Mo 0.1, B 3.2, Ag 0.028, Sn 0.37, , Co (0.38), V (0.15), Cr (1.8), Ni (3.5), Pb (1). The relative deviation (RSD) of each element is 4.06 ~ 9.94%. Test and results A standard formulation of the composition of the substrate: SiO 2 74, Fe 2 O 5 5, Al 2 O 5 12, MgO 2, CaCO 3 2, K 2 SO 4 3, Na 2 CO 5 2%. Grinding in an agate mortar, calcined at 800 ℃ for 10 hours after grinding again. SiO_2