论文部分内容阅读
ＳＥＮＳＩＴＩＶＩＴＹ（ＳＥ）代表电镜在照像时电子照射到电镜底片上的电子照射密度（σ）。通过测量、分析ＳＥ取各不同值时ＥＸＰＴＩＭＥ及其相应的ＣＵＲＲＥＮＴＤＥＮＳ的取值范围，计算出了与各ＳＥ值相对应的电子照射密度σ（即ＥＸＰＴＩＭＥ值与ＣＵＲＲＥＮＴＤＥＮＳ值的乘积）的取值范围。由此，分析、计算出ＳＥ与σ的函数关系及其关系曲线
SENSITIVITY (SE) represents the electron irradiation density (σ) of the electron microscope on the electron microscope when electron microscope is photographed. By measuring and analyzing the range of values of EXPTIME and its corresponding CURRENTDENS when different values of SE are taken, the ranges of the values of electron irradiation density σ (the product of EXPTIME value and CURRENTDENS value) corresponding to each SE value are calculated. From this, we analyze and calculate the functional relationship between SE and σ and its relation curve