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本文介绍在X射线荧光分析中,用基本参数法和蒙特卡罗法(Monte Carlo)进行古文物样品的分析。分析中我们用蒙特卡罗法计算了样品对入射线的散射校正因子以及探测器对特征X射线的相对探测效率。蒙特卡罗法是模拟随机过程的一种统计试验方法,其统计过程是通过随机事件的概率分布函数的随机抽样来实现。
This article describes the analysis of ancient artifacts in the X-ray fluorescence analysis using the basic parameter method and the Monte Carlo method. In the analysis, we used the Monte Carlo method to calculate the scattering correction factor for the incident ray and the relative detection efficiency of the detector for the characteristic X-ray. Monte Carlo method is a statistical test method for simulating stochastic processes. The statistical process is implemented by random sampling of the probability distribution function of random events.