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本文叙述了最近的磁埸测量法。着重分析了利用物质量子状态变化的方法,利用半导体电流磁效应的方法和利用磁芯非线性的方法,指出这三种典型方法的原理特点,最近的改进及其发展概况。
This article describes the recent magnetic 埸 measurement method. Emphasis is placed on the methods of using the change of quantum state of material, the method of using magnetic current of semiconductor and the method of using the core nonlinearity. The principle, the recent improvement and the general situation of these three typical methods are pointed out.