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关于钨中痕量元素的光谱测定已有很多报道,其中主要采用了载体分馏法。不少工作者还研究了用杂质预富集的光谱法或化学法和其它直接光谱法分析钨。但由于载
There have been many reports about the spectrometric determination of trace elements in tungsten, of which the carrier fractionation method is mainly used. Many workers have also studied spectroscopy or chemical methods for impurity preconcentration and other direct spectroscopic methods for the analysis of tungsten. But because of the load