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用红外热成像系统直接获得的热像图，是被测器件表面辐射温度的分布，并不是真实温度的分布。现介绍一套电子器件热辐射特性测试分析系统，可以方便地测定物体表面的真实温度分布与发射率分布。通过对一系列电子器件的测试，所获得的结果说明该系统是行之有效的，有着很广泛的用途。
The thermogram obtained directly with the infrared thermal imaging system is the distribution of the radiation temperature on the surface of the device under test and not the true temperature distribution. Now introduced a set of electronic devices thermal radiation test and analysis system, you can easily determine the true surface temperature and emissivity distribution. Through a series of tests of electronic devices, the results obtained show that the system is effective, has a very wide range of uses.