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基于pn结二极管辐射效应退化机理中位移效应和电离效应之间的关系,并结合pn结二极管辐射退化的噪声机理,得到了pn结二极管辐射诱导低频噪声的变化规律,发现两种效应引起的二极管噪声变化规律之间的不一致性.根据实验得到的噪声变化规律,判断出了辐射应力条件下两种效应之间的关系,很好地解释了实验中出现的不符合原有理论解释的现象,对器件加固的研究有着重要意义.
Based on the relationship between the displacement effect and the ionization effect in the degradation mechanism of pn junction diode and the noise mechanism of pn junction diode radiation degradation, the variation of low frequency noise induced by pn junction diode radiation was obtained. It was found that the two effects caused by the diode The inconsistency between the changes of the noise.According to the experimental results of the variation of the noise, the relationship between the two effects under the radiation stress is judged, and the phenomenon that does not accord with the original theory explained in the experiment is well explained, Research on device reinforcement is of great significance.