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本文叙述了某X波段金属内腔反射速调管的振荡功率曲线随负载变化时出现的凹坑或振荡中断现象,在分析该现象出现的原因时,应区分是由于电子多次渡越造成的迟滞现象、长线效应、负载过重、寄生诸振,还是由于谐振腔设计上的缺陷。 文章指出,在影响负载特性的诸因素中,谐振腔的设计,尤其是中央突起部分的隙缝电容与旁侧电容的合理分配,以及构成高频隙缝的栅网曲率最为重要。 文章简要介绍了寄生诸振的理论,指出了消除寄生造振的途径,并举出实例说明解决的方法。
This paper describes the phenomenon of pits or oscillations in the oscillation power curve of an X-band metal-cavity retro-klystron as the load changes. When analyzing the causes of this phenomenon, it is necessary to distinguish the phenomenon caused by multiple electron transitions Hysteresis, long-term effects, overloading, parasitic vibrations, or due to design flaws in the resonator. The article points out that among the factors that affect the load characteristics, the design of the resonator, especially the rational distribution of the crevice capacitance and the side capacitance of the central protuberance and the curvature of the grid forming the high-frequency slot, are of the utmost importance. The article briefly introduces the theory of parasitic vibration, points out the way to eliminate parasitic vibration and gives an example to illustrate the solution.