In this paper,a simulation system of pseudo-random testing is described first to investigate thecharacteristics of pseudo-random testing.Several interesting experimental results are obtained.It isfound out that initial states of pseudo-random sequences have little effect on fault coverage.Fixedconnection between LFSR outputs and circuit inputs in which the number of LFSR stages m is less thanthe number of circuit inputs n leads to low fault coverage,and the fault coverage is reduced as mdecreases.The local unrandomness of pseudo-random sequences is exposed clearly.Generally,when anLFSR is employed as a pseudo-random generator,there are at least as many LFSR stages as circuitinputs.However,for large circuits under test with hundreds of inputs,there are drawbacks of using anLFSR with hundreds of stages.In the paper,a new design for a pseudo-random pattern generator isproposed in which m