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应用系综统计法处理液/液界面双电层体系.根据MVN模型.建立系统的正则及巨正则配分函数,导出系统各热力学量统计平均.拟合计算界面内层构型熵(△S_m)及内层微分电容(C_1)随表面电荷密度(σ~m)变化关系.理论同时表明,C_1与σ~m或△(?)_1(界面内层电势降)的涨落存在确定关系.
The ensemble statistical method was used to deal with the double-layer system at the liquid / liquid interface. According to the MVN model, the regular and megalocalization partition functions of the system were established and the statistical averages of the thermodynamic quantities of the system were derived. And the inner differential capacitance (C_1) varies with the surface charge density (σ ~ m) .The theory also shows that there is a definite relationship between C_1 and σ ~ m or △ (?