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正常工作模式下的单通道320×240凝视型器件帧周期较长,给红外焦平面器件光谱测试带来新的问题。文中利用320×240读出电路的开窗功能解决了这一问题,从而实现了凝视型320×240器件的光谱测试,并为今后更大规模阵列的测试提供了一种技术途径。
The normal operation mode of the single channel 320 × 240 gaze type device frame longer, to the infrared focal plane device spectral test brings new problems. This paper solves this problem by using the windowing function of 320 × 240 readout circuit to realize the spectral test of the staring 320 × 240 device and provides a technical approach for the test of larger array in the future.