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采用胶体晶体模板方法,通过变换聚苯乙烯(PS)微球粒径和溅射时间制备了相同厚度的孔径1~5μm的Co反点阵列薄膜。利用扫描电子显微镜(SEM)、原子力显微镜(AFM)、X射线衍射(XRD)和振动样品磁强计(VSM)考察了样品的结构和磁学特性。发现Co反点阵列薄膜的矫顽力和剩磁比最大达到253.18×10-4 T和0.85,分别为Co薄膜的3.4和2.3倍,并且随孔径的增大逐渐降低。结合理论分析结果表明,Co反点阵列薄膜本身的形状各向异性是其取得优良磁学性能的原因,孔径和孔间距这两种形状因素造成的形状各向异性的变化是其磁性发生变化的物理本质。
A colloidal crystal template was used to fabricate Co anti-lamellar films with the same thickness of 1 ~ 5μm by changing polystyrene (PS) microspheres particle size and sputtering time. The structure and magnetic properties of the samples were investigated by SEM, AFM, XRD and VSM. It is found that the co-resistance and remanence ratio of Co anti-lattice thin films are up to 253.18 × 10-4 T and 0.85, which are 3.4 and 2.3 times that of Co thin films, respectively, and decrease gradually with the increase of the aperture. The results of theoretical analysis show that the shape anisotropy of Co anti-delamination film itself is the reason for its excellent magnetic properties. The change of shape anisotropy caused by the two kinds of shape factors such as the aperture and hole pitch is the change of its magnetic property Physical essence.