论文部分内容阅读
本文通过AES分析室内“模拟加速”和“就地分析”的新方法,探求显象管阴极的失效机理及与加速模式(Arrhenius方程)的内在联系。指出:阿氏方程中的指数因子E是代表阴极Ba蒸发的“表观活化能”;加速寿命在较大程度上受阴极表面Ba蒸发的限制,还预示了大加速比寿命试验的可能性。
In this paper, by means of AES, a new method of “analog acceleration” and “in-situ analysis” in the room is explored to explore the failure mechanism of the cathode of the CRT and its internal relations with the acceleration mode (Arrhenius equation). It is pointed out that the exponential factor E in the equation of Al is the “apparent activation energy” representing the evaporation of cathode Ba; the accelerated life is limited to a large extent by the evaporation of Ba on the cathode surface and also indicates the possibility of a large accelerated life test.