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在Na_5P_3O_(10)+NaOH+Na_2EDTA体系下,采用恒压模式对氢化锆进行微弧氧化处理获得连续、致密且裂纹、孔洞等缺陷较少的ZrO_2陶瓷层。通过扫描电镜(SEM)、X射线衍射(XRD)及能谱(EDS)仪,分析了陶瓷层的表面形貌、截面形貌、相结构及元素分布。通过真空脱氢实验及XRD分析对陶瓷层的阻氢性能进行评价。结果表明:氢化锆表面ZrO_2陶瓷膜厚度约为78μm,陶瓷层由过渡层、致密层和疏松层构成;ZrH_(1.8)表面微弧氧化陶瓷层主要由M-ZrO_2、T-ZrO_2及C-ZrO_2构成,主要为M-ZrO_2,约90%;微弧氧化陶瓷层氢渗透降低因子(PRF)高达11.7,具有优越的阻氢效果。
Under the Na_5P_3O_ (10) + NaOH + Na_2EDTA system, the ZrO_2 ceramic layer with continuous, dense and cracked pores and few defects was obtained by using the constant voltage mode. The surface morphology, cross-sectional morphology, phase structure and elemental distribution of the ceramic layer were analyzed by SEM, XRD and EDS. The hydrogen barrier properties of ceramic coatings were evaluated by vacuum dehydrogenation experiments and XRD analysis. The results show that the thickness of ZrO_2 ceramic film on zirconium hydride surface is about 78μm, and the ceramic layer is composed of transition layer, compact layer and loose layer. The micro-arc oxidation ceramic layer on ZrH_ (1.8) surface mainly consists of M-ZrO_2, T-ZrO_2 and C-ZrO_2 , Which is mainly composed of M-ZrO 2, about 90%. The PRR of the MAO layer is as high as 11.7, which has excellent hydrogen-occluding effect.