论文部分内容阅读
本文叙述了使用装有自动发散狭缝和石墨单色器的APD-15X射线衍射仪对经激光处理的GCr15进行了残余奥氏体含量的测定,处理层仅含有奥氏体和马氏体,其奥氏体含量高达22.39％。并研究了自动发散狭缝、单色器对衍射强度和残奥含量的影响。结果表明,若不采用计算机自动测量,则自动发散狭缝测得的衍射强度虽提高很多,但残余奥氏体含量反而下降,因而必须进行强度校正。单色器明显降低衍射强度,但若计算公式中包含有强度比,则试验测得的强度毋需校正,对结果不会有明显影响。在计算残余奥氏体含量时,采用本文列出的G因子或采用非单色器时的G因子均可获得令人满意的结果。
This paper describes the determination of residual austenite content of laser-treated GCr15 using an APD-15X diffractometer equipped with an automatic divergent slit and graphite monochromator. The treated layer contains only austenite and martensite, Its austenite content as high as 22.39%. The influence of auto-divergent slit and monochromator on diffraction intensity and Paralympic content was also studied. The results show that if automatic measurement is not used, the diffraction intensity measured by automatic divergent slits increases greatly, but the residual austenite content decreases instead, so the intensity correction must be performed. Monochromators significantly reduce the diffraction intensity, but if the formula contains intensity ratio, the intensity of the test measured without correction, the results will not have a significant effect. Satisfactory results were obtained when calculating the residual austenite content using either the G factor listed herein or the G factor with a non-monochromator.