Particle beam diagnostics have evolved rapidly in the past seven years. Today awide variety of instruments capable of making electrical, optical, X-ray, and particle me-asurements are in common use. The recent emphasis in particle beam and matter in-teractions, has encouraged the development of many new diagnostic methods. NovelX-ray streak photography and large PIN X-ray diode detector arrays were used to measurepinch formation of intense electron beams. Multi-frame holographic systems have beendeveloped to observe material response as well as the formation of plasma channels uscdfor beam-propagation. X-ray diodes for detecting soft X-rays have been used to measureemission from the hot plasma formed by parhcle beam irradiation, and a two-frame flash Particle beam diagnostics have evolved rapidly in the past seven years. Today a wide variety of instruments capable of making electrical, optical, X-ray, and particle me-asure are in common use. The recent emphasis in particle beam and matter in-teractions, has encouraged the development of many new diagnostic methods. NovelX-ray streak photography and large PIN X-ray diode detector arrays were used to measurepinch formation of intense electron beams. Multi-frame holographic systems have beendeveloped to observe material response as well as the formation of plasma channels uscdfor beam-propagation. X-ray diodes for detecting soft X-rays have been used to measure emission from the hot plasma formed by parhcle beam irradiation, and a two-frame flash