为评估日盲紫外(SBUV)像增强型CCD(ICCD)响应度随工作时间的变化规律,针对器件的两种典型工作模式设计了SBUV-ICCD疲劳特性测试方案,并构建装置对其进行了实验测量。首先结合SBUV-ICCD的基本结构和工作原理介绍了器件的两种工作模式;其次,定义了器件疲劳特性,提出了SBUV-ICCD疲劳性测试方案;最后,对两只SBUV-ICCD进行了疲劳特性测试,并分析了该测试方案的不确定度。实验结果表明:在光电模拟模式和光子计数模式下国内某型号SBUV-ICCD的疲劳特性分别为13%和3%,国外某型号SBUV-ICCD疲劳特性优于1%,本测试方案的不确定度为1%。 In order to assess the variation of ICCD responsivity with working time, a test scheme of fatigue characteristics of SBUV-ICCD was designed for two typical working modes of the device, and a device was constructed to test it measuring. Firstly, two working modes of the device are introduced according to the basic structure and working principle of SBUV-ICCD. Secondly, the device fatigue characteristics are defined and the fatigue test program of SBUV-ICCD is proposed. Finally, fatigue characteristics of two SBUV-ICCD Test, and analyzed the uncertainty of the test program. The experimental results show that the fatigue characteristics of a domestic model SBUV-ICCD are 13% and 3% respectively in the photoelectric simulation mode and the photon counting mode, and the fatigue characteristics of a certain model of SBUV-ICCD are better than 1%. The uncertainty of this test program 1%.