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通过对影响引信电子零部件长贮失效的主要环境因素（温度和湿度）分析，得出引信电子零部件长贮失效服从威布尔分布规律。单环境应力与双环境应力下分别满足阿伦尼斯和广义艾林模型，用恒定应力加速寿命试验方法，使温度和湿度相互作用加速效应等于零，推导出双环境应力下加速系数等于温度和湿度加速系数乘积。应用三组应力加速寿命试验的数据，计算出双环境应力下成布尔分布的形状参数、特征寿命、中位寿命等数值，从而估计出各种引信电于零部件长贮失效规律，对预测电子引信长贮可靠寿命，确定引信最佳贮存环境等具有一定参考价值。
By analyzing the main environmental factors (temperature and humidity) that affect the failure of fuze electronic components long storage, it is concluded that the long storage failure of fuze electronic components obeys Weibull distribution law. The single-environment stress and the double-environment stress respectively meet the Arrhenius and generalized Irin model, and the accelerated life test method is accelerated by the constant stress so that the accelerating effect of temperature and humidity interaction equals to zero. The accelerating coefficient under double environmental stress is equal to the acceleration of temperature and humidity Coefficient product. The data of three sets of stress accelerated life tests were used to calculate the shape parameters, the characteristic life and the median life under the double environmental stress, so as to estimate the failure rules of fuze for long storage of parts and components, Fuze long storage reliable life, to determine the best storage environment fuze has a certain reference value.