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采用真空蒸镀法制备了以TeOx 薄膜为记录层的可录光盘 ,采用溅射法制备了以Ag In Sb Te O为记录层的可擦重写光盘 ,并测试了这两种光盘在波长为 5 14 .5nm的动态存储特性。实验结果表明 ,可录光盘的载噪比在波长 5 14 5nm时达到 3 0dB ,波长 780nm时达到 41dB ;可擦重写光盘的载噪比在波长 5 14 5nm时达到 2 5dB ,波长 780nm时达到 3 8dB。对光盘载噪比偏低的可能原因及改进方法进行了讨论。光盘动态存储性能测试证明了这两种薄膜可用作蓝绿光波段高密度光存储介质。
A recordable optical disc with a TeOx film as a recording layer was prepared by a vacuum evaporation method. An erasable and rewritable optical disc with a recording layer of AgInSb TeO was prepared by a sputtering method. The two discs were tested at a wavelength of 5 14 .5nm dynamic storage characteristics. The experimental results show that the CDN achieves 30dB at 5145nm and 41dB at 780nm. The carrier-to-noise ratio of CD-RW reaches 25dB at 5145nm and reaches 780nm at 780nm 3 8dB. Discussed the possible causes of low CDNR and the improved methods. The dynamic storage performance test of the optical disk proves that these two films can be used as a high-density optical storage medium for blue-green light band.