根据用一次χ射线光谱分析稀土元素的原理,我们用薄样法以D-S型х射线荧光光谱仪制订了矿石矿物中稀土(钍)元素的测定方法。大家都知道,当试样薄到“临界厚度”以下时,选择吸收和选择激发的影响可以忽略不计,因而被测元素的谱线强度I_i与其含量C_i成比例,I_i=k_iC_i。每个稀土元素都可得到这样一个方程。由于稀土矿物大体可分为铈族、钇族和混合稀土三类,如果铈族稀土选钕作参比,钇族稀 Based on the principle of analyzing the rare earth elements by a χ-ray spectroscopy, we have developed a method for the determination of rare earth elements (thorium) in ore minerals using the D-S X-ray fluorescence spectrometer with the thin-film method. We all know that when the sample is thin to “critical thickness” below, the selective absorption and selective excitation can be neglected negligible, so the measured element line intensity I_i proportional to its content C_i, I_i = k_iC_i. Each rare earth element can get such an equation. As rare earth minerals can be roughly divided into three groups of cerium, yttrium and mixed rare earth, if rare earth cerium rare earth as a reference, yttrium rare