直接从 X-光衍射仪得到的原始数据,是对应于样品一系列衍射(和散射)方向的 X 光强度数据。这些数据,无论在准确性或重现性以及精细程度上,一般都比照相方法所得的数据好得多。但是,对于多晶 X 光衍射仪,X 光强度测值除了受仪器校直不良、计数系统的计数损失、样品制备不妥以及类似的误差来源的影响之外,还受两个统计性质因素的限制。由此引起的误差 The raw data obtained directly from the X-ray diffractometer is the X-ray intensity data corresponding to a series of diffraction (and scattering) directions of the sample. These data, in terms of accuracy or reproducibility and sophistication, are generally much better than data from photographic methods. However, for polycrystalline X-ray diffractometers, in addition to the effects of poor instrument alignment, loss of count in the counting system, poor sample preparation, and similar sources of error, x-ray intensity measurements are influenced by two statistical factors limit. The resulting error