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The isothermal phase diagram of the Cu2O-Al2O3-SiO2 ternary system at 1150°C was reported for the samples which were prepared from sol-gel method and quenched by water after being heated at 1150°C for 12 h. Based on the con-ventional X-ray powder diffraction (XRD) and in situ high-temperature XRD quantitative analysis,in addition to scanning electron microscopy measurement,the phase identification was achieved. Combining the deduction from the component phase diagrams of the binary systems using the phase equilibrium theorem,the primary isothermal phase diagram was plot-ted over the composition area Cu2O-mullite-SiO2. In this area,the approximate composition areas of two two-phase regions and one three-phase region,(L2+Cr),(L2+M),and (L1+L2+Tr),were determined. Moreover,the precise composition ar-eas of both of the three-phase regions (L2+Cr+M) and (L2+M+A) were determined according to the results of conven-tional and in situ high-temperature XRD quantitative analysis by Rietveld method.
The isothermal phase diagram of the Cu2O-Al2O3-SiO2 ternary system at 1150 ° C was reported for the samples which were prepared from sol-gel method and quenched by water after being heated at 1150 ° C for 12 h. Based on the con- Conventional X-ray powder diffraction (XRD) and in situ high-temperature XRD quantitative analysis, in addition to scanning electron microscopy measurement, the phase identification was achieved. Combining the deduction from the component phase diagrams of the binary systems using the phase equilibrium theorem , the primary isothermal phase diagram was plot-ted over the composition area Cu2O-mullite-SiO2. In this area, the approximate composition areas of two two-phase regions and one three-phase region, (L2 + Cr) The precise composition ar-eas of both of the three-phase regions (L2 + Cr + M) and (L2 + M + A) were determined according to the results of conven-tional and in situ high-temperature XRD quantitative analysis by Rietveld met hod.