在X射线定量相分析的外标法中有Leroux等人[1]解决二元物相系的方法,它需用实验来作校正曲线,且难以推广到复相系.1966年,Karlark和Burnett[2]提出能解决多相系且衍射线重叠的外标法,当无重叠线时,由于实验和计算比较繁杂,因而很不方便.此短文提出一种简化的外标法. 一、原 理 In the external standard method of X-ray quantitative phase analysis, Leroux et al. [1] solved the method of binary phase facies, which needed to be calibrated by experiments and was difficult to generalize to complex facies. In 1966, Karlark and Burnett [2] proposed an external standard method that can solve the problem of multi-phase system and the overlapping of diffraction lines. When there is no overlap line, it is very inconvenient because of the complicated experiment and calculation. This essay proposes a simplified external standard method.