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利用溶胶-凝胶法首先在玻璃基片上制备了氧化锡晶种膜,之后采用溶剂热法在其上生长了致密的氧化锡薄膜。利用扫描电子显微镜和X射线衍射技术对氧化锡薄膜的形貌和晶体结构进行了表征,结果表明构成薄膜的氧化锡晶粒具有四方锡石结构,尺寸在7~10 nm之间。表面活性剂在溶剂热反应过程中对薄膜生长的研究表明,十二烷基苯磺酸钠可以显著提高薄膜的质量。对所制备的氧化锡薄膜进了气敏性质研究,结果表明,在温和的测试条件下,如室温、常压、干燥的空气背景等,该氧化锡薄膜对二氧化氮气体具有良好的探测能力,检测限为0.5μL·L-1。
The sol-gel method was used to prepare a tin oxide seed crystal film on a glass substrate, followed by a solvothermal method to grow a dense tin oxide film thereon. The morphology and crystal structure of tin oxide thin films were characterized by scanning electron microscopy and X-ray diffraction. The results show that the tin oxide grains forming the thin films have tetragonal cassiterite structure with the size of 7-10 nm. Studies on the growth of the film during the solvothermal reaction of surfactant show that sodium dodecyl benzene sulfonate can significantly improve the quality of the film. The gas-sensitive properties of the prepared tin oxide films were studied. The results show that the tin oxide films have good detection ability for nitrogen dioxide gas under mild test conditions, such as room temperature, atmospheric pressure and dry air background , The detection limit of 0.5μL · L-1.