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5. NEW UHR SEM COMBINED WITH I-FIB FOR MATERIAL SCIENCE

NEW UHR SEM COMBINED WITH I-FIB FOR MATERIAL SCIENCE

来源 :第十六届北京分析测试学术报告会 | 被引量 : 0次 | 上传用户：zhangliye5

【摘 要】

：

As a leading manufacturer of the instruments for electron microscopy,TESCAN is a well-known brand with good reputation in various fields of the applications of

【出 处】

：

第十六届北京分析测试学术报告会

【发表日期】

：

2015年10期

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As a leading manufacturer of the instruments for electron microscopy,TESCAN is a well-known brand with good reputation in various fields of the applications of SEM together with novel design.

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